传统的 BIST结构中 ,由于 LFSR产生大量的测试矢量在测试过程中消耗了大量的功耗。为了减少测试矢量的数目而不影响故障覆盖率 ,我们提出了一种新的基于双模式 LFSR的低功耗 BIST结构。首先介绍了功耗模型和延迟模型的基础知识 ,然后给出了用于生成双模式 LFSR的矩阵 ,并介绍了解矩阵方程式的算法。随后说明了新的 BIST结构和用于矢量分组的模拟退火算法。最后 ,基于 Benchmark电路的实验证明这种结构可以在不降低故障覆盖率的同时减少70 %的功耗 In the traditional BIST structure, a large amount of test power is consumed by the LFSR during testing. In order to reduce the number of test vectors without affecting the fault coverage, we propose a new low-power BIST architecture based on dual-mode LFSR. First, the basic knowledge of power model and delay model is introduced. Then, the matrix for generating dual-mode LFSR is given and the algorithm for solving matrix equation is introduced. The new BIST structure and the simulated annealing algorithm for vector grouping are subsequently described. Finally, experiments based on the Benchmark circuit prove that this architecture can reduce power consumption by 70% without reducing fault coverage