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以散射背景作内标的荧光X射线光谱分析法及其物理基础的研究已有不少文献报导。但尚欠统一的理论处理,散射波长的选择亦靠反复实验取得,况且也只能解决轻基物中微量重元素的分析。作者在有效原子序数20以下的轻基物中,以分析线位置的背景值作内标,对钾盐矿中微量铷、锶、溴等元素进行了大量的实验。实验表明,对试样的物理状态、仪器条件变化、基体效应都获得了良好的补偿。但是,随着基体有效原子序数的增大,峰背比值随原子序数的变化就不如峰值强度随原子序数的变化灵敏,方法也就失效。因此本文试图从分析线位置的背景强度与质量吸收系数之间的关系,探讨峰背比法的基体补偿,以求得对各种岩石中微量重元
There have been many reports on the research of fluorescence X-ray spectrometry with its scattering background as an internal standard and its physical basis. However, there is still a unified theoretical treatment. The choice of scattering wavelength is also obtained by repeated experiments. In addition, only the analysis of trace heavy elements in light substrates can be solved. In light substrates with effective atomic numbers below 20, a large amount of experiments on trace amounts of rubidium, strontium, bromine and other elements in potash ore have been carried out with the background value of analytical line as the internal standard. Experiments show that the physical state of the sample, the instrument conditions change, the matrix effect have been well compensated. However, with the increase of the effective atomic number of the matrix, the peak-to-back ratio is not as good as the change of the atomic number as the peak intensity changes with the atomic number, and the method fails. Therefore, this paper attempts to analyze the relationship between the background intensity of the line position and the mass absorption coefficient to explore the matrix back-to-peak method of compensation in order to obtain a variety of rocks in the trace heavy element