原子力显微镜(AFM—AtomicForceMicroscope)可以分辨变形珠光体的纳米级组织结构,结合扫描电子显微镜(SEM) ,定量和定性信息联系起来,对力学性能的径向梯度进行观察。1　试验程序5 .5mm碳素珠光体共析盘条拉拔到 0 .3mm(总的真应变ε=3.8)。采用电化学浸蚀方法,将钢丝放在装浸 Atomic Force Microscope (AFM-Atomic Force Microscope) can distinguish the deformation of pearlite nanoscale structure, combined with scanning electron microscopy (SEM), quantitative and qualitative information linked to the mechanical properties of the radial gradient was observed. 1 Test Procedure 5 .5mm carbon pearlite eutectoid coil drawing to 0.3mm (total true strain ε = 3.8). Using electrochemical etching method, the wire on the dip