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本文通过制备了一个基于并五笨为有源层的顶栅底接触OTFT器件获取电流电压实验数据,并运用电流电压特性曲线理论拟合计算方法计算其场效应迁移率.研究发现,采用不同的拟合方法得到的场效应迁移率值有较大的差异.若选取转移特性曲线线性区距中心1/2范围内测试点进行最小二乘拟合计算出的场效应迁移率能减少采用其他拟合方法的固有不准确性,而且与其他方法得到的场效应迁移率最接近.
In this paper, a five-stupid active top-bottom-contact OTFT device was fabricated to obtain the experimental data of current and voltage, and the field-effect mobility was calculated using the current-voltage characteristic curve theory calculation method. The study found that different Fitting method to obtain the field effect mobility values are quite different.If the transfer characteristic curve of the linear distance from the center of 1/2 test points least square fitting calculated field effect mobility can be reduced using other proposed Inherent inaccuracy of the method, and with other methods to get the closest field-effect mobility.