在光学生产中,表面评定的最普通方法是用光学检验板.检验板的主要缺点是由于接触可能造成表面损伤以及对每个不同的表面需要用不同的检验板.本文介绍的表面测量干涉仪可以单独测量曲率半径及表面的面形.因为所有曲率误差可以化为零,评定表面面形的过程可以简化.本文也介绍了干涉仪的其它有效的应用. In optical production, the most common method of surface evaluation is the use of optical inspection plates. The main disadvantages of inspection plates are the possible surface damage due to contact and the need for different inspection plates for each different surface. The surface measurement interferometer The radii of curvature and surface profile can be measured separately, as all curvature errors can be reduced to zero and the process of surface profiling can be simplified. Other useful applications of the interferometer are also described.