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一、信号寻迹法信号寻迹法实际上是信号注入法和波形观察法的综合检测法。它特别适用于对具有多级放大器的电子量仪(如:晶体管毫伏表、示渡器的X轴或Y轴的放大系统以及量仪中的各种放大器等)的故障检查、分析,提供可靠依据,以此能迅速确定故障的部位。检查时,使用适当频率和振幅的外部信号源,作为测试信号加到待修仪器的输入端(或被测多级放大器最前面一级的输入端),然后用外部的电子示波器,从信号输入端开始,逐一观察其后各级放大器的输入、输出信号的波形和振幅,以寻找反常的迹象。如果某一级放大器的输入端信号电压正常,而输出端信号电
First, the signal tracing method Tracing method is actually a signal detection and waveform observation method of comprehensive detection. It is particularly suitable for fault checking, analysis, provision of electronic meters with multistage amplifiers (eg, millivolt meters for transistors, amplification systems for X- or Y-axis of amplifiers, various amplifiers in gauges, etc.) Reliable basis, in order to quickly determine the fault site. During the test, an external signal source of appropriate frequency and amplitude is applied as a test signal to the input of the device under test (or the input of the first stage of the multistage amplifier under test), and then from an external electronic scope The beginning, one by one to observe the subsequent levels of amplifier input and output signal waveform and amplitude, in order to find abnormal signs. If a certain level of amplifier input signal voltage is normal, and the output signal power