用电子探针微分析器作定量微分析时,往往需要均匀的标准。分析的准确度取决于标准的组成与样品组成接近的程度。遗憾的是,要选择适当的标准存在很多困难,在某些情况下,甚至是不可能的。但是,如果电子探针微分析是基于X射线的强度与出射角的依赖关系,那么这种情况就会得到改善,Philibert在他对于深度分布函数Φ(Z)的研究中最先应用了这种关系。Ridnik指出了应用这种关系作为无标准定 Quantitative microanalysis with an electron probe microanalyzer often requires a uniform standard. The accuracy of the analysis depends on how close the standard composition is to the sample composition. Unfortunately, there are many difficulties in choosing the right standard, and in some cases, even impossible. However, if the electron-probe microanalysis is based on the dependence of the x-ray intensity on the exit angle, this situation improves, and Philibert first applied this in his study of the depth distribution function Φ (Z) relationship. Ridnik pointed out that the application of this relationship as a non-standard set