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在100—650K内的不同温度下,对掺杂K—Al—Si(钾—铝—硅)的商业钨棒和钨丝(φ0.9、0.3,0.18mm)进行了开裂试验。新鲜的开裂面立即用AES(俄歇电子光谱仪)研究,随后用扫描电镜对其作形貌观察。主要结果如下:a)在常规试验中,钾会沿着开裂面展散开,若将样品保持在100K以下,可以避免这种展散;b)经一次和二次再结晶的钨丝,其开裂是沿着钾第二相较密集的区域发生的;c)在烧结棒和粗丝中,除有气泡外,也还存在准二维的钾第二相;d)开裂源于被氧化的晶界或被氧化的微裂纹;e)丝纵裂时,有时出现钾和氧分布的不均匀性。
Cleavage tests were performed on commercial tungsten rods and tungsten wires (φ 0.9, 0.3, 0.18 mm) doped with K-Al-Si (potassium-aluminum-silicon) at different temperatures of 100-650K. Freshly cracked surfaces were immediately studied by AES (Auger electron spectroscopy), followed by morphological observation with a scanning electron microscope. The main results are as follows: a) In conventional tests, potassium spreads along the cracked surface and this spreading can be avoided if the sample is kept below 100K; b) The primary and secondary recrystallized tungsten filaments Cracking occurs along the more densely packed second potassium zone; c) There are also quasi-two-dimensional potassium second phases in both the sintered rod and the thick wire; d) Cracking originates from the oxidized Grain boundaries or oxidized microcracks; e) longitudinal cracking of the potash and sometimes uneven distribution of potassium and oxygen.