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从理论上探讨了测微晶尺寸及微观应变的Ｘ射线单峰傅氏分析法，并用由此理论编制的计算机软件进行了实际测量，实测表明这是一种快速、简便、准确的方法．
The X-ray single-peak Fourier analysis method of micrometric crystal size and micro-strain was theoretically discussed. The actual measurement was made by using the computer software programmed by this theory. The actual measurement shows that this method is a fast, simple and accurate method.