本文提出了一种测试防振台隔振性能的方法。随着科学技术的飞速发展,防振研究越来越受到人们的普遍重视。如计算机图象处理技术、超高精度的光学干涉仪器、全息摄影、光栅刻度、大规模集成电路板的光刻和其它的高精度科学实验等都必须进行隔振。采用防振台来减少振动对科学研究和生产实验所带来的不利影响,是当前防振措施中最主要的方法之一。 This paper presents a method of testing vibration isolation performance. With the rapid development of science and technology, more and more attention has been paid to anti-vibration research. Vibration isolation must be carried out, such as computer image processing techniques, ultra-high precision optical interferometry, holography, grating scales, lithography of large scale integrated circuits, and other high-precision scientific experiments. The adoption of anti-vibration platform to reduce the adverse effects of vibration on scientific research and production experiments is one of the most important methods in anti-vibration measures.