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[期刊论文] 作者：Chih-Wei Liao,Jiun-Hung Yu,Yeo,
来源：中国颗粒学报：英文版 年份：2010
An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is t...
[期刊论文] 作者：Chih-Wei Liao,Jiun-Hung Yu,Yeong,
来源：Particuology 年份：2020
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[期刊论文] 作者：Chih-Wei Liao,Jiun-Hung Yu,Yeong-Shin Tarng,,
来源：Particuology 年份：2010
An on-line full scan inspection system is developed for particle size analysis. A particle image is first obtained through optical line scan technology and is then analyzed using digital image process...
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