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本文介绍了一种测定透明薄膜衰减系数K_λ的方法。其要点是:1.测定透明薄膜的有效透过率τ_λ~*;2.测定透明薄膜的有效反射率ρ_λ~*;3.利用τ_λ~*=τ_λ~*[ρ_λ,τ_λ=exp(-K_λd)]和ρ_λ~*=ρ_λ~*[ρ_λ,τ_λ=exp(-K_λd)]进行迭代求解,算出K_λ。 本方法的主要优点是,利用衰减系数K_λ,就可以用计算方法确定任意厚度d的透明薄膜的光谱和全波长热辐射性质,即:ρ_λ~*、τ_λ、τ_λ~*、ε_λ和ρ~*、τ~*、ε。 基于所述方法,作者对聚四氟乙烯透明薄膜的热辐射性质进行了论证性测定研究。结果表明,这种方法是可行的。
This paper presents a method to determine the attenuation coefficient K_λ of a transparent film. The key points are as follows: 1. The effective transmission rate of the transparent film is determined as τ_λ ~ *; 2. The effective reflectivity of the transparent film is determined as ρ_λ ~ *; 3. The effective reflectivity of the transparent film is calculated using τ_λ ~ * = τ_λ ~ * [ρ_λ, τ_λ = exp (-K_λd )] And ρ_λ ~ * = ρ_λ ~ * [ρ_λ, τ_λ = exp (-K_λd)] are iteratively solved to calculate K_λ. The main advantage of this method is that using the attenuation coefficient K_λ, the spectral and full-wavelength thermal radiation properties of a transparent thin film of arbitrary thickness d can be determined by calculation: ρ_λ ~ *, τ_λ, τ_λ ~ *, ε_λ and ρ ~ * , Τ ~ *, ε. Based on the described method, the author conducted a demonstration study on the heat radiation properties of the transparent film of polytetrafluoroethylene. The results show that this method is feasible.