理化之窗单晶表面微小应变研究中国科学院上海冶金研究所研制的“高精度Ｘ射线双晶衍射仪”（双晶Ⅱ型），可用于测量单晶表面微小应变。该仪器测量点阵参数相对变化，仪器精度可达Ｍ＜６Ｘ１０－’。在大的角度范围（２０＜１６５”）有２０：６自动扫描，特别适合作大失... Micro-strain on the single-crystal surface of the window of physics and chemistry The “high-precision X-ray double crystal diffraction instrument” (double crystal type Ⅱ) developed by Shanghai Institute of Metallurgy, Chinese Academy of Sciences, can be used to measure the small strain on single crystal surface. The instrument to measure the relative changes in lattice parameters, instrument accuracy up to M <6X10- ’. In the wide angle range (20 <165 ") has a 20: 6 automatic scanning, especially suitable for large loss ...