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采用三辛胺(TOA)修饰碳糊电极(TOA/CPE)测定了Cr(Ⅵ)含量,并考察了最佳的实验条件。当富集时间为10 min,富集介质为0.15 mol/L H2SO4时,TOA/CPE能够有效地富集Cr(Ⅵ)。以溶出伏安法测定Cr(Ⅵ),在-0.45 V(vs.SCE)处有灵敏的还原峰,峰电流与Cr(Ⅵ)浓度在5.0×10-7~1.0×10-3mol/L范围内呈现良好的线性关系。干扰试验显示TOA/CPE对Cr(Ⅵ)具有高选择性,能够在Cr(Ⅲ)浓度是Cr(Ⅵ)600倍时准确测定Cr(Ⅵ),检出限达3.4×10-9mol/L(S/N=3)。TOA/CPE测定了实际样品电子引脚中的Cr(Ⅵ),实验结果与紫外分光光度法结果一致。
The content of Cr (Ⅵ) was determined by TOA / TOE / CPE and the best experimental conditions were investigated. TOA / CPE can effectively enrich Cr (Ⅵ) when the enrichment time is 10 min and the enrichment medium is 0.15 mol / L H2SO4. The stripping voltammetric method for the determination of Cr (Ⅵ) has a sensitive reduction peak at -0.45 V (vs.SCE), the peak current and the Cr (Ⅵ) concentration ranged from 5.0 × 10-7 to 1.0 × 10-3 mol / L Within the show a good linear relationship. The interference test showed that TOA / CPE has high selectivity to Cr (Ⅵ), and Cr (Ⅵ) can be accurately detected when the concentration of Cr (Ⅲ) is 600 times Cr (Ⅵ). The detection limit is 3.4 × 10-9mol / S / N = 3). TOA / CPE measured the actual sample of electronic pins Cr (Ⅵ), the experimental results and UV spectrophotometry results.