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天线反射面精度是天线系统主要的技术性能指标,一般要求表面精度是天线工作波长的1/16～1/32,而测量精度要达到表面精度的1/3～1/5。对于毫米波/亚毫米波天线,传统测量方法如经纬仪测量等存在很多缺点,本文提出一种新的测量技术,利用工业摄影测量技术对毫米波/亚毫米波天线形面进行测量,并进行了高精度天线形面测量实践,结果满足要求。
The accuracy of the antenna reflection surface is the main technical performance index of the antenna system. Generally, the surface accuracy is 1/16 to 1/32 of the working wavelength of the antenna, and the measurement accuracy needs to reach 1/3 to 1/5 of the surface accuracy. For the millimeter-wave / sub-millimeter-wave antennas, there are many shortcomings of the traditional measurement methods such as theodolite measurement. In this paper, a new measurement technique is proposed to measure the shape of the millimeter-wave / sub-millimeter wave antenna using the industrial photogrammetry technology. High-precision antenna surface measurement practice, the results meet the requirements.