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报道了Ｘ射线荧光光谱法直接测定电工硅钢钢屑样品微量元素的新方法，校正了样品中元素间的基体效应影响和校正了钢屑样品的不同颗粒结构，不同几何形态及不同表面状态的影响，使钢屑样品可不经处理直接测定，操作简便。
A new method for direct determination of trace elements in electrical steel samples by X-ray fluorescence spectrometry was reported. The influence of matrix effect between elements in samples and the effects of different particle structures, different geometries and different surface states on the samples were corrected , So that steel samples can be directly measured without treatment, easy to operate.