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前言石墨是六方晶体,对于理想石墨单晶a=2.461A,C=3.354A。由此决定了石墨单晶具有明显的各向异性。而对于多晶石墨亦具有类似的各向异性。这主要由于原材料的粒度、形状及成形等致使晶体具有选优取向排列的结果。这里介绍用X射线衍射仪,测定相对于挤压方向和模压方向的(002)面随角位置的分布,结合贝康的理论推导出计算公式,来测定各种石墨的异向度指数的方法。
Preface Graphite is a hexagonal crystal, a = 2.461A for ideal graphite single crystal, C = 3.354A. This determines the graphite single crystal has obvious anisotropy. For polycrystalline graphite also has a similar anisotropy. This is mainly due to the particle size, shape and shape of the raw materials, resulting in the preferred orientation of crystals. The X-ray diffractometer is used here to measure the distribution of the (002) plane with respect to the extrusion direction and the (002) plane camber position, and the method of deducing the calculation formula from Bekon’s theory to determine the index of dissimilarity of various kinds of graphite .