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由于不确知那些不属于IP芯核测试集的测试矢量的无故障响应,造成在伪随机测试下测试者无法获取被测IP芯核的无故障特征,上述事实构成了测试数字IP芯核的挑战之一。基于多特征检验原理,研究了适用于数字IP芯核的内建自测试(B IST)实现方法———MSCB IST。分析了多特征比较的故障混叠概率,并给出了其近似值。通过执行芯片上的多特征检查,显著降低了故障的潜隐性。MSCB IST无需存储多个无故障特征,支持并行的测试和特征检查,可以显著减少功能测试中的测试时间和降低故障混叠的概率。MSCB IST既可以用于确定性测试,也可以用于伪随机测试。
Due to the unproven failure-free response of test vectors that are not part of the IP core test set, the fact that the tester can not obtain the fault-free characteristics of the tested IP core under the pseudorandom test constitutes the test of the digital IP core One of the challenges. Based on the principle of multi-feature test, the method of built-in self-test (B IST) for digital IP core is studied --- MSCB IST. The probability of fault aliasing based on multi-feature comparison is analyzed and its approximation is given. By performing multiple feature checks on the chip, the potential for failure is significantly reduced. The MSCB IST eliminates the need to store multiple non-faulty features and supports parallel testing and signature checking, significantly reducing the test time in functional testing and reducing the probability of fault aliasing. The MSCB IST can be used for both deterministic and pseudorandom tests.