目的研制Ｘ射线机输出量波形测试装置，测量Ｘ射线机输出量波形。方法选用Ｎａｌ（ＴＩ）晶体探测器，把Ｘ射线量转化成电信号，经放大器放大后，由计算机存储、平滑、显示。结果应用研制的测试装置，测试了单相全波整流和三相六波整流Ｘ射线机的输出量波形。结论使用该装置可以方便地测试Ｘ射线机的输出量波形，检测Ｘ射线机的电气性能。 Objective To develop an X-ray machine output waveform test device and measure the X-ray machine output waveform. Methods The Nal (TI) crystal detector was used to convert the X-ray quantity into electrical signals. After the amplifiers were amplified, they were stored, smoothed and displayed by the computer. Results Using the developed test device, the output waveforms of single-phase full-wave rectification and three-phase six-wave rectification X-ray machine were tested. Conclusion The device can be used to conveniently test the output waveform of the X-ray machine and detect the electrical performance of the X-ray machine.