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根据电子产品所存在的明显失效和潜在失效以及产品因报废而使寿命有限的实际 ,对传统失效率曲线作了修正 ,所提出的模型可用于分析描述产品筛选和老练过程中的失效规律。
According to the obvious failure and potential failure of electronic products and the limited life expectancy of the products, the traditional failure rate curve is modified. The proposed model can be used to analyze the failure rules in the process of product screening and sophistication.