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微处理机的复杂性和固有可靠性使得我们难以找出适当表示其性能特点,指出其固有可靠性的测试方法。对于微处理机的测试,我们所感兴趣的方法有两种:弱点分析法(WPA)和结点工作温度测量法(JOT)。前者着眼于芯片设计中的潜在失效点;后者着眼于提供芯片可靠性的有关估算。这两种方法都是通过测试8080A 来说明的。
The complexity and inherent reliability of microprocessors make it difficult to find a test that adequately represents its performance characteristics and points out its inherent reliability. There are two ways that we are interested in testing microprocessors: weak point analysis (WPA) and junction temperature measurement (JOT). The former looks at potential failure points in chip design; the latter looks at providing estimates of chip reliability. Both of these methods are illustrated by testing the 8080A.