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4.混成焦平面列阵性能的比较对于焦平面列阵技术的比较工作来说,探测率和操作温度是关键的一级判别因子。图5所示为热探测率(300 K)随温度的变化曲线。这种热探测率是通过把一个具有给定D~*的理想热探测器的NE△T同一个具有给定D~*(λ_p)的理想光子探测器
4. Mixed into the focal plane array performance comparison For the comparison of focal plane array technology, the detection rate and operating temperature is a critical first-class discriminant. Figure 5 shows the thermal detection rate (300 K) with temperature curve. This thermal detection rate is obtained by combining an NE Δ T of an ideal thermal detector with a given D ~ * with an ideal photon detector of a given D ~ * (λ_p)