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建立了2 5 2 Cf裂片源模拟空间重离子的单粒子烧毁 (SEB)和单粒子栅穿 (SEGR)效应的实验方法和测试装置 ,并利用该装置进行了功率MOS场效应晶体管的SEB、SEGR效应研究 ,给出了被测试器件SEB、SEGR效应的损伤阈值。结果表明 ,该测试系统和实验方法是可行、可靠的。
The experimental method and device for simulating the single heavy ion desorption (SEB) and single-particle gate-break (SEGR) effects of spaceborne heavy ions with 2 5 2 Cf source were established. The SEB, SEGR Effect study, the damage threshold of SEB and SEGR effect of tested devices is given. The results show that the test system and experimental methods are feasible and reliable.