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设计了一种利用半导体激光器InGaAs/I作为光源 ,采用钽酸锂热释电探测器作为光接收元件 ,以 80 31单片机为核心的中、高温物体比辐射率及温度的实时测量系统。该系统主要由光学发射与接收系统、信号放大与处理系统和显示系统三部分组成。文中还介绍了该系统的基本原理及结构 ,分析了其中的技术难点及其解决方法 ,讨论了系统的灵敏度、比辐射率与温度的测量精度。分析表明 :对 42 7℃的抛光钢铸件而言 ,系统的最小鉴别温差为 0 32K ,比辐射率的测量精度σελ=6 5× 10 -3 ,|σελ/ελ|=1 2 0 % ;温度的测量精度σT =1 0 6K ,|σT/T|=0 15 2 %。
A real-time measurement system of specific emissivity and temperature of medium and high temperature objects with 8031 single-chip microcomputer as the light-receiving element is designed using a semiconductor laser InGaAs / I as a light source, a lithium tantalate pyroelectric detector as a light-receiving element. The system consists of optical transmitting and receiving system, signal amplification and processing system and display system composed of three parts. The paper also introduces the basic principle and structure of the system, analyzes the technical difficulties and solutions, and discusses the system sensitivity, emissivity and temperature measurement accuracy. The analysis shows that for the polished castings at 427 ℃, the minimum temperature difference between the systems is 0 32K. The measurement accuracy of the emissivity is εελ = 6 5 × 10 -3 and | εελ / ελ | = 120%. The temperature The measurement accuracy of σT = 1 0 6K, | σT / T | = 0 15 2%.