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在检定和使用立式接触干涉仪时,首先必须按下式调整仪器的刻度值:n=(λK/2i)式中 n——K 个干涉条纹间隔中所应包含的刻度间隔数;λ——单色光的波长;i——仪器的分度值。其实质是以分划板格数一定,用改变干涉条纹的多少来决定仪器的刻度值。由于每台仪器所带干涉滤光片巅值波长(λ)的不同,工作前的计算是不可免的(那怕是最简单的计算),这给仪器检修员下广工作带来一些麻烦。是否可用再简单一点的办法来调整仪器的刻度值呢?我们在工作中是这样做的,即用固定干涉条纹数量(20条)改变与它相对应的分划板格数的方法来调
When verifying and using a vertical contact interferometer, the scale value of the instrument must first be adjusted as follows: n = (λK / 2i) where n - the number of angular intervals to be included in the K interference fringes; λ - - the wavelength of monochromatic light; i - the graduation value of the instrument. The essence is to divide the number of grid plate a certain, with the number of interference fringes to determine the scale value of the instrument. Because of the difference in peak wavelength (λ) of the interference filter carried by each instrument, pre-work calculations are inevitable (even the simplest ones), which causes some troubles to the instrument staff. Is it possible to adjust the scale of the instrument in a simpler way? In our work, we did this by changing the number of retarder plates with a fixed number of interference fringes (20)