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对近年来扫描探针显微 (SPM)技术 (扫描隧道显微镜STM和原子力显微镜AFM)在TiO2 表面的形貌、结构和物理化学性质研究中的应用进行了综述。
In recent years, the application of scanning probe microscopy (SPM) technology (scanning tunneling microscope STM and atomic force microscope AFM) in the study of morphology, structure and physical and chemical properties of TiO2 surface has been reviewed.