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研究了小波图像边缘检测技术在荧光寿命显微像分析中的应用，利用小波分析的多尺度特性进行了荧光寿命显微像的边缘提取。结果表明，这种方法非常有效。
The application of wavelet image edge detection technology in fluorescence lifetime microscopy analysis is studied. The edge extraction of fluorescence lifetime microscopy is carried out by using the multi-scale characteristics of wavelet analysis. The results show that this method is very effective.