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低密度聚乙烯材料中的空间电荷包现象通常会引起严重电场畸变而影响其击穿特性.本文借鉴半导体中的耿氏效应的负微分迁移率机理来描述电荷包的形成机理,并结合载流子的注入条件及体内陷阱对电荷迁移的影响等因素,对文献中报道的两类外加场强不同且迁移趋势各异的空间电荷包行为进行了模拟仿真,模拟的电荷包大小随电场变化规律,电荷包迁移速率随时间变化规律等与相应实验结果符合.模拟结果表明,产生耿氏效应的负微分迁移率是造成电荷包非弥散传输的主要原因,其与材料电极注入情况及体内陷阱态的共同作用导致了空间电荷包行为迁移的多样性.
The phenomenon of space charge packet in low-density polyethylene usually leads to serious electric field distortion and affects its breakdown characteristics.In this paper, the formation mechanism of charge packets is described by reference to the mechanism of negative differential mobility of Gunn effect in semiconductors, Sub-injection conditions and the impact of the trap on the charge transfer and other factors, the literature reported in the two different field strength and migration trend of the different space charge packet behavior simulated the charge packet size with the change of electric field , And the change rule of the charge packet migration with time are consistent with the corresponding experimental results.The simulation results show that the negative differential mobility resulting from the Gunn effect is the main reason for the non-dispersive charge packet transmission, which is related to the material electrode implantation and the in vivo trap state The combined effect of space charge packet migration caused by the diversity.