Hf isotope measurement has been carried out for UHP metamorphic eclogite from Xindian by using LA-MC-ICP-MS technique. The result indicates that metamorphic growth zircon has high 176Hf/177Hf (0.282544-0.282612) and low 176Lu/177Hf (0.000004-0.000211) ratio, inherited and recrystallized protolith zircon has low 176Hf/177Hf (0.282266-0.282466) and high 176Lu/177Hf (0.000090-0.002144) compositions. The low 176Lu/177Hf of growth zircon comes from its decreasing of Lu and increasing of Hf during UHP process. The high 176Hf/177Hf deduced from high radiogenic 176Hf, which was produced from long-term evolution of high Lu/Hf ratio minerals. Partial recrystallization of protolith zircon would not cause reworking of Lu/Hf isotope in zircon. Compared to U-Pb, zircon Lu-Hf system has better stability. The initial Hf isotope composition of metamorphic growth zircon may represent the Hf isotope composition of whole rock system at the same time. The initial εHf of +3.0 for metamorphic precursor formation of Xindian eclogite indicates that the source material mainly derived from weak depleted mantle or mixing of depleted mantle with old crust.