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分别采用金相法、扫描电镜EDX能谱、光电直读光谱法测试4032铝合金铸锭表面偏析层厚度。结果发现,采用光电直读光谱法虽能准确检测出偏析层厚度,但检测过程繁琐且检测费用较高;而采用扫描电镜EDX法很难准确地检测出偏析层厚度;采用金相法能简单、快速地检测出偏析层厚度,铸锭表面到粗大α-Al树枝晶的距离即为偏析层厚度。
The thickness of the surface segregation layer of 4032 aluminum alloy ingot was tested by metallographic method, scanning electron microscope (EDX) and photoelectric direct reading spectroscopy. The results show that although the thickness of the segregation layer can be accurately detected by photoelectric direct reading spectroscopy, the testing process is complicated and the testing cost is high. However, the thickness of the segregation layer can not be accurately detected by the scanning electron microscope EDX method. The metallographic method is simple and fast The thickness of the segregation layer was detected. The distance from the ingot surface to the coarse α-Al dendrite was the thickness of the segregation layer.