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原子探针是一种独特的仪器,它与常用的显微分析研究电子光学仪器完全不同。从概念上讲,它是很简单的。然而其显微组织和显微化学分辨率非常高,可以显示和分析单个原子(特别是在数据收集和处理的计算机控制方面,仪器最近的进展大大提高了原子探针作为材料科学分析工具的多功能性)。这种仪器成功地应用于包括相变和界面偏析研究的广阔领域。本文介绍原子探针的基本概念和一般操作特征,并用实例说明它在低合金高强度钢的沉淀强化、辐照材料和热处理合金中的偏析以及相变方面的应用。
Atomic probe is a unique instrument, which is very different from the commonly used electron microscopy analytical electronic instruments. Conceptually, it is very simple. However, its microscopic and microscopic chemical resolution is very high, allowing the display and analysis of individual atoms (especially with regard to computer control of data collection and processing. Recent advances in instrumentation have greatly increased the use of atomic probes as a material science analysis tool Feature). This instrument has been successfully used in a wide range of fields including phase change and interfacial segregation. This paper introduces the basic concepts and general operating characteristics of the atomic probe. It also illustrates the application of the atom probe in precipitation hardening of low-alloy high-strength steels, segregation in the irradiated materials and heat-treated alloys, and phase transitions.