四氯化硅是采用最多的一种光导纤维材料,为了减少信息在输送过程中的衰减,对光导纤维材料的纯度要求很高,特别是铜、铁、钴、镍、铬、铂、钒、锰等杂质的含量只允许在ppb(十亿分之一)数量级范围内.对于这类超纯材料中痕量杂质的分析,在光谱分析方面有人用化学光谱法和控制气氛化学光谱法等途径来提高分析的灵敏度.近年来,空心 Silicon tetrachloride is one of the most widely used optical fiber materials. In order to reduce the attenuation of information during transportation, the purity of optical fiber materials is very high, especially copper, iron, cobalt, nickel, chromium, platinum, vanadium, Manganese and other impurities only allowed in the ppb (one billionth) of the order of magnitude.To trace impurities in such ultra-pure materials analysis, in the spectral analysis of some people with chemical spectroscopy and controlled atmosphere chemical spectroscopy and other means To increase the sensitivity of the analysis. In recent years, hollow