针对CMOS(Complementary Metal Oxide Semiconductor)图像传感器成像系统中普遍存在的动态范围小和响应线性度差的问题,提出了一种兼顾图像传感器动态范围及响应线性度的方法——多斜率积分线性恢复。该方法在固定复位电压值的多斜率积分基础上,通过测得传感器的分段响应临界值,得出分段响应与线性响应映射关系,根据该映射关系对实测图像数据进行线性恢复。通过采用具体成像系统,对比使用该方法前后的成像质量和直方图统计后得出:不同的分段积分参数对线性恢复的影响不同,在合适的参数下,该方法能够有效地提高CMOS图像传感器的动态范围及响应线性度。 Aiming at the problems of small dynamic range and poor response linearity in the imaging system of CMOS (Complementary Metal Oxide Semiconductor) imaging sensor, a method to reconcile the dynamic range and response linearity of the image sensor is proposed. Based on the multi-slope integral of the fixed reset voltage, this method obtains the relationship between the segment response and the linear response by measuring the critical response of the sensor. Based on the mapping, the measured image data is linearly restored. Comparing the imaging quality and histogram before and after using this method, we can get the conclusion that the influence of different piecewise integral parameters on linear restoration is different, and under the appropriate parameters, this method can effectively improve the CMOS image sensor Dynamic range and response linearity.