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In optical studies on layered structures, quantitative analysis of radiating interfaces is often challenging due to multiple interferences. We present here a general and analytical method for computing the radiation from two-dimensional polarization sheets in multilayer structures of arbitrary compositions. It is based on the standard characteristic matrix formalism of thin films, and incorporates boundary conditions of interfacial polarization sheets. We use the method to evaluate the second harmonic generation from a nonlinear thin film, and the sum-frequency generation from a water/oxide interface, showing that the signal of interest can be strongly enhanced with optimal structural parameters.