开展了电荷耦合器件(CCD)质子辐照损伤的实验研究.分析了质子辐照CCD后电荷转移效率的退化规律,阐述了质子辐照诱导电荷转移效率退化的损伤机理,比较了不同能量质子对电荷转移效率的损伤程度.通过开展辐射粒子输运理论计算,分析了不同能量质子对电荷转移效率损伤差异的原因. An experimental study on charge-coupled device (CCD) proton irradiation damage was carried out.The degradation rules of charge transfer efficiency after proton irradiation were analyzed, and the damage mechanism of proton irradiation induced degradation of charge transfer efficiency was expounded. Compared with different energy proton pairs Charge transfer efficiency of damage degree.Under the theoretical calculation of radiation particle transport, analysis of the different energy protons on the charge transfer efficiency damage caused by the difference.