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目的：为了探讨缺氧缺血性脑病（ＨＩＥ）、新生儿血浆内皮素（ＥＴ） 和血清一氧化氮（ＮＯ） 水平的变化。方法：采用放射免疫法和硝酸还原酶法，分别测定４５ 例ＨＩＥ患儿及１５ 例正常新生儿血浆ＥＴ和血清ＮＯ 水平。结果：血浆ＥＴ 水平在ＨＩＥ急性期明显升高，且中、重度ＨＩＥ 组ＥＴ 水平明显高于轻度ＨＩＥ组及对照组（ Ｐ＜ ０－０１ ，０－００１） ，恢复期血浆ＥＴ 水平下降，仅重度ＨＩＥ 组明显高于对照组（ Ｐ＜０－０５） ；血清ＮＯ 水平在急性期较低，在恢复期呈持续增高，各组两两相互比较，差异有显著性（ Ｐ＜０－０５，０－０１ ，０－００１） 。结论：血浆ＥＴ和血清ＮＯ水平是反映实质性脑损伤的重要指标。ＥＴ 和ＮＯ 可能参与窒息所致脑损伤的病理过程。
Objective: To investigate the changes of plasma endothelin (ET) and serum nitric oxide (NO) levels in neonates with hypoxic-ischemic encephalopathy (HIE). Methods: Plasma ET and serum NO levels were measured in 45 HIE infants and 15 normal neonates by radioimmunoassay and nitrate reductase method respectively. Results: The level of plasma ET increased significantly during the acute phase of HIE, and the level of ET in moderate and severe HIE group was significantly higher than that in mild HIE group and control group (P <0-01, 0-001) Only severe HIE group was significantly higher than the control group (P <0-05); serum NO levels in the acute phase was lower, continued to increase in the recovery period, the two groups compared with each other, the difference was significant (P <0-05 , 0-01, 0-001). Conclusion: Plasma ET and serum NO levels are important indicators of substantial brain injury. ET and NO may participate in the pathogenesis of asphyxial brain injury.