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为了简捷地测量交流等离子体显示器(ACPDP)保护膜的放电特性,提出了用测量ACPDP放电特性和加速老化特性来探求保护膜发射和稳定性能的间接测量方法,并依此原理研制了模拟ACPDP放电特性的测量装置.该装置由驱动电源、放电室及真空系统组成,能够模拟ACPDP的工作条件和过程,可用来测量ACPDP工作过程中用不同材料、方法及工艺制成的保护膜的工作电压、稳定性等,从而衡量保护膜的二次电子发射性能,还可用来测量ACPDP放电单元内所充气体的种类、混合比例、压力以及放电间隙的距离等参数对ACPDP放电特性的影响
In order to measure the discharge characteristics of the ACPDP protective film simply and conveniently, an indirect measurement method of measuring ACPDP discharge characteristics and accelerated aging properties to explore the emission and the stability of the protective film was proposed. Based on this principle, an analog ACPDP discharge The device consists of a driving power supply, a discharge chamber and a vacuum system and can simulate the working conditions and processes of the ACPDP and can be used to measure the working voltage of the protective film made of different materials, methods and processes during the ACPDP working process, Stability, etc., to measure the protective film secondary electron emission properties, but also can be used to measure the type of gas charged in the ACPDP discharge cells, mixing ratio, pressure and discharge gap distance and other parameters on the ACPDP discharge characteristics