本文主要叙述了MM—2装置通过ECRH加热等离子体并形成热电子环的实验诊断方法,原理、结果和讨论。该方法采用多栅分析器测得了冷等离子体电子密度和温度、离子密度和温度、冷电子端损失分布和冷等离子体电子密度经向分布、寿命及电子环的位置大小。本文还扼要介绍了低频扰动的测量方法测得电子环的形成时间和存在时间。 This paper describes the experimental diagnosis method, principle, results and discussion of MM-2 device heating plasma by ECRH and forming hot electron rings. The method uses a multi-gate analyzer to measure the cold plasma electron density and temperature, the ion density and temperature, the cold electron end loss distribution and the cold plasma electron density meridional distribution, the life span and the position of the electron ring. This article also briefly introduces the measuring method of low-frequency perturbation to measure the formation time and the existence time of the electronic ring.