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利用垂直沉积技术制备了高质量的二氧化硅蛋白石结构和光子晶体异质结构,采用扫描电镜和光学透射谱进行了样品的结构表征。对同一样品不同区域的扫描电镜照片进行快速傅里叶变换分析,证实了胶体晶体的长程有序排列。通过对具有不同晶格常数的二氧化硅蛋白石结构的光学透射谱进行研究,提出光学透射谱中透射背景向短波长区域平滑的下降可能来自于结构缺陷散射的影响。与相应的蛋白石结构相比,光子晶体异质结构的光子禁带明显展宽,禁带深度也相对变浅,推测其来自于膜厚的影响。异质结构中各个光子禁带位置与蛋白石结构相比,并没有发生明显的移动。通过谱图对比研究,分析了光子禁带的叠加效应。
High-quality silica opal structures and photonic crystal heterostructures were prepared by vertical deposition technique. The structure of the samples was characterized by scanning electron microscopy and optical transmission spectroscopy. Scanning electron micrographs of different regions of the same sample were subjected to fast Fourier transform analysis, confirming the long-range ordered arrangement of the colloidal crystals. By studying the optical transmission spectra of silica opal structures with different lattice constants, it is proposed that the smooth drop of the transmitted background to the short wavelength region in the optical transmission spectrum may come from the influence of structural defect scattering. Compared with the corresponding opal structure, the photonic band gap of the photonic crystal heterostructure broadens obviously and the forbidden band depth is also relatively shallow, which is presumed to come from the influence of the film thickness. Heterogeneous structure of each photon forbidden band position compared with the opal structure, and no significant movement. By comparing the spectra, we analyzed the superposition effect of photonic band gaps.