论文部分内容阅读
介绍了一种制备表面纳米化样品的横截面透射电镜试样方法,利用该方法对经高能喷丸处理的工业纯钛进行了透射电镜观察与分析。结果显示:用改进的抛丸机,在合适的工艺参数下进行高能喷丸处理,在工业纯钛的表面得到了约10μm深的纳米层;晶粒尺寸由表及里逐渐过渡,纳米表层与基体间无明显的界面,表层晶粒大小在50nm左右,取向随机,为等轴状纳米晶。结果表明,该制样方法,克服了表面自身纳米化样品由于残余应力造成的弯曲变形,可以得到适合于透射电镜观察的横截面试样。
A cross-section transmission electron microscopy (TEM) method for the preparation of nanosized samples was introduced. Transmission electron microscopy was used to observe and analyze the industrial pure titanium treated by high-energy shot peening. The results show that with the improved shot blasting machine, high-energy shot peening is carried out with appropriate process parameters, and the nanocrystalline layer with a depth of about 10 μm is obtained on the surface of the industrial pure titanium; the grain size gradually transitions from the surface to the surface, No obvious interface between the substrate, the surface grain size of about 50nm, random orientation, equiaxed nanocrystals. The results show that the sample preparation method can overcome the bending deformation caused by the residual stress on the surface nanocrystalline sample, and the cross-section sample suitable for TEM observation can be obtained.