本文将最优化组合设计与数据分析结合起来用于校正 ICP—AES 中的干扰效应。通过对组合设计进行改进,使设计过程及分析测定更加简化。以 APPLEⅡ微机通过 BASIC 程序对测得数据进行脱机处理,能够准确地对 ICP—AES 分析中复杂基体产生的光谱干扰和基体效应进行校正。 This article combines the optimal combination design with data analysis to correct the effects of interference in ICP-AES. Through the combination of design improvements, the design process and analysis and measurement more streamlined. Taking APPLE II computer through BASIC program to process the measured data offline, the spectral interference and matrix effect produced by complex matrix in ICP-AES can be corrected accurately.