论文部分内容阅读
本文提出了衍射或荧光分析用的X射线管原级X射线谱强度分布的定量测定方法。在带有正比、闪烁计数管的衍射仪上用LiF分光晶体进行展谱测定。实验测定强度经校正计算还原为X射线管窗口处的强度。对荧光X射线管还应测定几个射线束方向的原级谱加以平均求得有效原级谱。分析了原级X射线谱数据的误差及其对基本参数法等实际应用的影响。
This paper presents a method for the quantitative determination of intensity distribution of primary X-ray spectra of X-ray tube for diffraction or fluorescence analysis. Spectra were measured with a LiF spectrometer on a diffractometer with a proportional, scintillation counter tube. The intensity of the experimentally measured intensity was restored to the intensity at the window of the X-ray tube by the corrective calculation. On the fluorescent X-ray tube should also be measured in the direction of the primary beam of several beam directions to obtain an effective primary spectrum. The error of primary X-ray spectrum data and its influence on the practical application such as basic parameter method are analyzed.