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云母晶体材料本身性质所决定的双折射率色散关系不一致性 ,对于波片设计是一个棘手的问题 .与传统的样品普遍鉴别测量方法不同的是 ,该文试图从介绍分析双折射率的精确测量方法入手 ,通过必要的技术处理 ,达到直接采用单波长的测量结果代替多波长的测量结果 ,最终推断出任意波长或任意样品材料对应的波片相位延迟 .此方法较之传统测量方式简捷快速实用 ,可满足云母波片系列化生产需要 .
The inconsistency of the birefringence dispersion relationship, which is determined by the nature of the mica crystal material, is a thorny problem for wave plate design.Different from the traditional method of universal differential measurement, this article attempts to analyze the accurate measurement of birefringence Method, and through the necessary technical processing, the measurement result of single wavelength is directly used instead of the measurement result of multiple wavelengths, and finally the phase retardation of the wave plate corresponding to an arbitrary wavelength or an arbitrary sample material is deduced finally. Compared with the traditional measurement method, , To meet the mica wave plate serial production needs.