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本文给出一种分析Moire条纹的Fourier方法,这一方法比常规的几何分析法和衍射分析法简法、直观,且同衍射分析法同样严谨。文中除分析了通常两光栅所形成的Moire条纹外,还分析了包括干涉条纹光场照明光栅时,以及两干涉条纹光场交叠时的情况。上述三种情况实际上包含了可能产生 Moire 条纹的所有物理情况。文中还详细分析了Moire条纹的净化和对比度改善问题,并给出了净化和改善对比度的途径。实验结果证实了分析的正确性。
This paper presents a Fourier method for the analysis of moire fringes. This method is simple, intuitive and accurate as the conventional diffraction and diffraction methods, compared to conventional geometric and diffraction methods. In addition to analyzing Moire fringes formed by two regular rasters, we also analyze the situation when the fringes including the fringes are overlapped and the light fields of two fringes overlap. The above three cases actually cover all the physical conditions that may produce Moire stripes. In the paper, the problem of purifying and contrasting Moire stripes is also analyzed in detail, and the ways to purify and improve the contrast are given. The experimental results confirm the correctness of the analysis.