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应用辅助判据有效地提高了主动监控法镀膜的可靠性;实现了行波半导体激光放大器的金属化封装;研究了在光分路领域应用的可能性。
The application of the auxiliary criterion effectively improves the reliability of the active monitoring method coating. The metallization encapsulation of the traveling-wave semiconductor laser amplifier is realized. The possibility of application in optical shunting is also studied.