CCD接收到过强信号时会出现电荷溢出现象,对于无溢出漏级结构的CCD,需合理设置成像系统参数避免出现电荷溢出。针对滨松帧转移型CCD对非强目标成像时出现的电荷溢出现象,分析其原因是由行读出过程中成像区长时间电荷积累而导致的,通过积分之前的多次帧转移,有效解决了电荷溢出问题,并基于积分球实验进一步论证了原因及解决方法。 Charge overflow occurs when the CCD receives an excessive signal. For a CCD with no overflow leakage structure, the imaging system parameters should be properly set to avoid charge overflow. Aim at the phenomenon of charge overflow when Hamamatsu frame transfer CCD imaged non-strong target, it is analyzed that the reason is caused by the accumulation of charge in long time in the imaging area during the line readout, which is effectively solved by multiple frame transfer before integration The problem of charge overflow is also discussed. The reasons and solution are further demonstrated based on the experiment of integrating sphere.