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采用溶胶-凝胶法制备了Cu、Co共掺的Zn0.95-xCo0.05CuxO(x=0,0.01,0.03,0.05)薄膜,并用金相显微镜和X射线衍射(XRD)研究了样品薄膜的形貌和结构,结果发现掺杂量影响着衍射峰的强度和位置。测量了样品的室温光致发光谱(PL谱),所有样品均观察到紫外发光带和蓝光发光带,同时伴随有较弱的绿光发光带。微量Cu掺杂能够显著提高ZnO∶Co薄膜的发光强度,对样品的发光机制进行了讨论。
The films of Zn0.95-xCo0.05CuxO (x = 0,0.01,0.03,0.05) co-doped with Cu and Co were prepared by sol-gel method. The microstructure of the samples was investigated by means of metallographic microscope and X-ray diffraction Morphology and structure, the results showed that the amount of doping affect the diffraction peak intensity and location. The room temperature photoluminescence spectra (PL spectra) of the samples were measured. All of the samples were observed ultraviolet and blue light bands, accompanied by weak green light bands. Trace Cu doping can significantly improve the emission intensity of ZnO: Co films, and the luminescence mechanism of the samples is discussed.