Anisotropic magneto-resistance of single crystal ferromagnetic film

来源 :中国物理学会2012年秋季学术会议 | 被引量 : 0次 | 上传用户:h8x8x8
下载到本地 , 更方便阅读
声明 : 本文档内容版权归属内容提供方 , 如果您对本文有版权争议 , 可与客服联系进行内容授权或下架
论文部分内容阅读
Anisotropic magneto-resistance (AMR) effect in the magnetic films and multilayers has received an increased interest in recent years owing to the unique magnetoresistive characteristics of such materials and their use as magnetoresistive devices.This effect,in polycrystalline ferromagnetic films,only depends on the orientation of the magnetization (M) with respect to the electric current (J) direction [1].
其他文献
Current information technology includes information procession and information storage which are carried out by charge-based devices and magnetic material respectively.To efficient manipulate the orie
Ferromagnetic semiconductor (Ga,Mn)As has attracted great attention for both fundamental physics and potential applications since its discovery in 1990s[1].Most attractive properties of (Ga,Mn)As resu
稀土正铁氧体HoFeO3具有Fe3+ 和Ho3+ 两套磁性子晶格,因此展现出丰富的磁性质.已有的研究表明:在T<647 K以下,Fe3+发生反铁磁有序,反铁磁轴沿a方向,c方向具有弱的铁磁分量;51 K<T<62 K,Fe3+发生自旋变向,反铁磁轴由a方向逐渐变到c方向;T<51 K,反铁磁轴沿c方向;当T<4.5 K时,Ho3+发生反铁磁有序.
High quality Co doped ZnO thin films are grown on single crystalline AL2O3 (0001) by oxygen plasma assisted molecular beam epitaxy.Micro-Raman measurements were performed to study the influence of Co
ZnS是一种重要的Ⅱ-Ⅵ族宽带隙半导体材料,具有较高的红外透射率、荧光效应和电致发光功能等光电特性[1].采用液相法合成了具有室温铁磁性的ZnxCo1-xS(x=0.01)稀磁半导体.XRD结果表明Zn0.99Co0.01S纳米颗粒具有单一的闪锌矿结构.
Semiconductor spintronics is expected to one of the potential technologies which can outperform the conventional semiconductor devices.An important hurdle in this field is the inefficient injection of
兼具磁性与铁电性的复合薄膜,由于其在信息存储以及设计新型的驱动器、换能器、传感器、自旋电子器件、新型记忆元等方面有很大的应用前景,在国际国内吸引了很多的研究兴趣.
半金属Fe3O4具有较高的居里温度(858 K)和理论上100%的自旋极化率,是自旋电子学器件的理想候选材料,但其四重轴对称各向异性磁电阻的来源尚有争议[1].我们用反应溅射法在MgO(100)基底上制备了不同掺杂量的外延Cr(Mn)xFe3-xO4薄膜.采用X射线衍射(XRD)、扫描电子显微镜(SEM)等手段对样品的微观结构进行了分析,用磁性测量系统(MPMS)测量了样品的磁性质,用物理性质测量
拓扑绝缘体同时具有绝缘体和导体双重性,即在块材内部是有帯隙的绝缘态,但在表面却存在无帯隙的金属表面态.拓扑绝缘体的表面金属态完全是由材料的体电子态的拓扑结构所决定,是由对称性所决定的,与表面的具体结构无关.所以,它的存在非常稳定,基本不受到杂质与无序的影响.
Anomalous positive magnetoresistance (MR) up to 36% was observed at 2 K and 12 T in the undoped amorphous carbon (a-C) film deposited on glass substrate by pulsed laser deposition at 500 ℃.There was n