Reconstruction of electrostatic images from electrostatic force microscopy in the vicinity of steps

来源 :The 6th International Conference on Nanoscience and Technolo | 被引量 : 0次 | 上传用户:ciweiqiu
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  The lateral resolution in Atomic force microscopy(AFM)is mainly determined by the size of the tip which contributes most significantly to the total interaction between tip and sample.
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